SIMPLE DEPTH PROFILE DETERMINATION BY PROTON-INDUCED X-RAY-EMISSION

被引：30
|
作者：
AHLBERG, M [1 ]
机构：
[1] LUND INST TECHNOL,DEPT NUCL PHYS,LUND,SWEDEN
来源：
NUCLEAR INSTRUMENTS & METHODS | 1975年 / 131卷 / 02期
关键词：
D O I：
10.1016/0029-554X(75)90345-6
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：381 / 384
页数：4
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