DEPTH PROFILE DETERMINATION BY ION-INDUCED X-RAY SPECTROSCOPY

被引：33
|
作者：
PABST, W [1 ]
机构：
[1] TECH UNIV MUNICH,LEHRSTUHL INTEGRIERTE SCHALTUNGEN,MUNICH,WEST GERMANY
来源：
NUCLEAR INSTRUMENTS & METHODS | 1974年 / 120卷 / 03期
关键词：
D O I：
10.1016/0029-554X(74)90028-7
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：543 / 545
页数：3
相关论文
共 50 条
  • [31] Non-destructive compositional depth profile analysis by Hard X-Ray Photoelectron Spectroscopy
    Rubio-Zuazo, J.
    Castro, G. R.
    PROCEEDINGS OF THE 17TH INTERNATIONAL VACUUM CONGRESS/13TH INTERNATIONAL CONFERENCE ON SURFACE SCIENCE/INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY, 2008, 100
  • [32] Emission statistics of X-ray induced photoelectrons and its comparison with electron- and ion-induced electron emissions
    Ohya, K.
    Inai, K.
    Nisawa, A.
    Itoh, A.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2008, 266 (04): : 541 - 548
  • [33] DAMAGE PROFILE OF ION-IMPLANTED GAAS BY X-RAY PHOTOELECTRON-SPECTROSCOPY
    LU, ZH
    AZELMAD, A
    TRUDEAU, Y
    YELON, A
    APPLIED PHYSICS LETTERS, 1989, 55 (09) : 846 - 848
  • [34] DETERMINATION OF GERMANIUM BY FLUORESCENT X-RAY SPECTROSCOPY
    CAMPBELL, WJ
    CARL, HF
    WHITE, CE
    ANALYTICAL CHEMISTRY, 1955, 27 (02) : 319 - 319
  • [35] In-depth Analysis of X-ray Photoelectron Spectroscopy Using Giant Cluster Ion Bombardment
    Iijima, Yoshitoki
    Sakai, Yuji
    Hiraoka, Kenzo
    BUNSEKI KAGAKU, 2013, 62 (10) : 865 - 878
  • [36] Ion-induced pattern formation on Co surfaces: An x-ray scattering and kinetic Monte Carlo study
    Malis, O
    Brock, JD
    Headrick, RL
    Yi, MS
    Pomeroy, JM
    PHYSICAL REVIEW B, 2002, 66 (03): : 354081 - 354089
  • [37] 4He2+ ion-induced L x-ray emission cross sections of ytterbium
    UAE Univ, Al-Ain, United Arab Emirates
    J Phys B At Mol Opt Phys, 24 (5693-5700):
  • [38] 4He2+ ion-induced L x-ray emission cross sections of ytterbium
    Hallak, AB
    JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1997, 30 (24) : 5693 - 5700
  • [39] Time resolved characterization of metal ion-induced nanocellulose gelation by small angle X-ray scattering
    He, HongRui
    Rosen, Tomas
    Zhan, Chengbo
    Wang, Ruifu
    Chodankar, Shirish
    Yang, Lin
    Hsiao, Benjamin
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2019, 258
  • [40] X-ray induced damage in DNA monitored by X-ray photoelectron spectroscopy
    Ptasinska, Sylwia
    Stypczynska, Agnieszka
    Nixon, Tony
    Mason, Nigel J.
    Klyachko, Dimitri V.
    Sanche, Leon
    JOURNAL OF CHEMICAL PHYSICS, 2008, 129 (06):
12345