DEPTH PROFILE DETERMINATION BY ION-INDUCED X-RAY SPECTROSCOPY

被引：33
|
作者：
PABST, W [1 ]
机构：
[1] TECH UNIV MUNICH,LEHRSTUHL INTEGRIERTE SCHALTUNGEN,MUNICH,WEST GERMANY
来源：
NUCLEAR INSTRUMENTS & METHODS | 1974年 / 120卷 / 03期
关键词：
D O I：
10.1016/0029-554X(74)90028-7
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：543 / 545
页数：3
相关论文
共 50 条
  • [1] ION-INDUCED X-RAY SPECTROSCOPY AS A METHOD TO DETERMINE DEPTH DISTRIBUTION OF TRACE-ELEMENTS
    PABST, W
    NUCLEAR INSTRUMENTS & METHODS, 1975, 124 (01): : 143 - 147
  • [2] SYSTEM FOR DETERMINATION OF ELEMENT-CONCENTRATION DEPTH PROFILES FROM ION-INDUCED X-RAY YIELD
    VLASOV, AA
    BLOKHIN, SM
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1989, 32 (05) : 1222 - 1224
  • [3] DEPTH PROFILE MEASUREMENTS OF COPPER IN SILICON BY ION-INDUCED X-RAY-EMISSION
    BERNHARD, F
    KERKOW, H
    KUDELLA, F
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1980, 49 (1-3): : 107 - 111
  • [4] DEPTH PROFILES OF ION-INDUCED STRUCTURAL-CHANGES IN DIAMOND FROM X-RAY PHOTOELECTRON-SPECTROSCOPY
    EVANS, S
    PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1978, 360 (1702): : 427 - 443
  • [5] ION-INDUCED CHARACTERISTIC X-RAY MICROANALYSIS
    BEEZHOLD, W
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1973, 120 (03) : C96 - &
  • [6] HIGH-RESOLUTION ION-INDUCED X-RAY SPECTROSCOPY FOR CHEMICAL-STATE ANALYSIS
    FOLKMANN, F
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 75 (1-4): : 9 - 13
  • [7] Depth profiling of ion-induced damage in D9 alloy using X-ray diffraction
    Dey, S.
    Gayathri, N.
    Mukherjee, P.
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2018, 173 (3-4): : 300 - 317
  • [8] DETERMINATION OF COMPOSITION AND DEPTH PROFILE OF TREATED ENAMEL USING X-RAY PHOTOELECTRON-SPECTROSCOPY
    NALEWAY, C
    THORN, RJ
    MCCREARY, JR
    HEFFERREN, J
    ZIMMERMAN, M
    SCHROTENBOER, G
    JOURNAL OF DENTAL RESEARCH, 1978, 57 : 182 - 182
  • [9] Copper L x-ray spectra measured by a high resolution ion-induced x-ray spectrometer
    Kawatsura, K
    Kageyama, H
    Takahashi, R
    Hamaguchi, D
    Arai, S
    Aoki, Y
    Yamamoto, S
    Takeshita, H
    Naramoto, H
    Kambara, T
    Oura, M
    Kanai, Y
    Awaya, Y
    RADIATION PHYSICS AND CHEMISTRY, 1997, 49 (06): : 617 - 622
  • [10] Effect of Depth Profile on Ar(Kα) Intensity of β-ray Induced X-ray Spectroscopy Spectrum in Tritium Measurement
    Chen Y.
    Chen Z.
    Yang Y.
    Qu J.
    Cheng S.
    Li Y.
    Yuanzineng Kexue Jishu/Atomic Energy Science and Technology, 2021, 55 (12): : 2368 - 2373
12345