APPLICATIONS OF LASER IN METROLOGY - SURVEY

被引:0
|
作者
FELSKE, A [1 ]
机构
[1] VOLKSWAGENWERK AG, ABT FORSCH & ENTWICKLUNG, D-3180 WOLFSBURG, BUNDES REPUBLIK
来源
TECHNISCHES MESSEN | 1976年 / 43卷 / 10期
关键词
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:295 / 304
页数:10
相关论文
共 50 条
  • [31] Ultrafast laser processing and metrology
    Nomaru, Keiji
    Morikazu, Hiroshi
    Takahashi, Kunimitsu
    [J]. 2014 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO), 2014,
  • [32] METROLOGY OF LENGTH BY LASER INTERFEROMETRY
    SCHUSSLER, HH
    [J]. TECHNISCHES MESSEN, 1985, 52 (06): : 225 - 232
  • [33] Intranet applications in the metrology laboratory
    Erickson, J
    [J]. SUCCESS IN THE 21ST CENTURY DEPENDS ON MODERN METROLOGY, VOLS 1-2, 1997, : 505 - 508
  • [34] Wavelets and their applications for surface metrology
    Jiang, X.
    Scott, P.
    Whitehouse, D.
    [J]. CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2008, 57 (01) : 555 - 558
  • [35] Blue Microlasers for Metrology Applications
    Matsko, Andrey
    Savchenkov, Anatoliy
    Eliyahu, Danny
    Seidel, David
    Williams, Skip
    [J]. PROCEEDINGS OF THE 2019 JOINT CONFERENCE OF THE IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM AND EUROPEAN FREQUENCY AND TIME FORUM (EFTF-IFCS 2019), 2019,
  • [36] Blockchain Applications for Legal Metrology
    Peters, Daniel
    Wetzlich, Jan
    Thiel, Florian
    Seifert, Jean-Pierre
    [J]. 2018 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC): DISCOVERING NEW HORIZONS IN INSTRUMENTATION AND MEASUREMENT, 2018, : 1527 - 1532
  • [37] Survey and technological analysis of laser and its defense applications
    Syed Affan Ahmed
    Mujahid Mohsin
    Syed Muhammad Zubair Ali
    [J]. Defence Technology, 2021, 17 (02) : 583 - 592
  • [38] Survey and technological analysis of laser and its defense applications
    Ahmed, Syed Affan
    Mohsin, Mujahid
    Ali, Syed Muhammad Zubair
    [J]. DEFENCE TECHNOLOGY, 2021, 17 (02) : 583 - 592
  • [39] Metrology and mathematics - Survey on a dual pair
    Ruhm, Karl H.
    [J]. ADVANCED MATHEMATICAL AND COMPUTATIONAL TOOLS IN METROLOGY AND TESTING XI, 2019, 89 : 85 - 118
  • [40] Signal processing for in-line process monitoring for coaxially integrated metrology in laser micromachining applications
    Kunze, Rouwen
    Bredol, Philipp
    Schmitt, Robert
    [J]. AT-AUTOMATISIERUNGSTECHNIK, 2017, 65 (06) : 416 - 425