MISFIT DISLOCATION-STRUCTURES AT MBE-GROWN SI1-XGEX/SI INTERFACES

被引：27
|
作者：
FUKUDA, Y
KOHAMA, Y
SEKI, M
OHMACHI, Y
机构：
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1988年 / 27卷 / 09期
关键词：
D O I：
10.1143/JJAP.27.1593
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：1593 / 1598
页数：6
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