CHARACTERIZATION OF MATERIALS, THIN-FILMS, AND INTERFACES BY OPTICAL REFLECTANCE AND ELLIPSOMETRIC TECHNIQUES

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作者：

ASPNES, DE

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来源：

ACS SYMPOSIUM SERIES | 1986年 / 295卷

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中图分类号：

O6 [化学];

学科分类号：

0703 ;

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页码：192 / 207

页数：16

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