DEVICE FOR DETERMINATION OF DIELECTRIC PARAMETERS OF MATERIALS AT LOW AND HIGH-FREQUENCIES

被引：0
|
作者：
KISELEV, VI
SULTANAEV, RM
机构：
来源：
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 1991年 / 34卷 / 03期
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中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A device for dielectric spectroscopy in the frequency range of from 10(2) to 10(6) Hz is described. The device, which operates with a computer, permits automatic measurements with the data presented in tables or graphs. The measurement errors are 2.5% for the dielectric constant-epsilon and 3% for the loss tangent tan-delta.
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页码：665 / 668
页数：4
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