MICROMAGNETIC CHARACTERISTICS OF SINGLE-LAYER PERMALLOY-FILMS IN THE NANOMETER RANGE

被引：7
|
作者：
GILLIES, MF
CHAPMAN, JN
KOOLS, JCS
机构：
[1] Department of Physics and Astronomy, Glasgow University, Glasgow
[2] Philips Research Labs., 5656 AA Eindhoven
来源：
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1995年 / 140卷
关键词：
D O I：
10.1016/0304-8853(94)00820-5
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The micromagnetic properties of thin (5-20 nm) permalloy films, prepared by UHV magnetron sputtering, have been studied by Lorentz microscopy. Using the high resolution of the differential phase contrast mode the generation and growth of domains and the development of magnetisation ripple has been studied as a function of layer thickness, field strength and direction.
引用
收藏
页码：721 / 722
页数：2
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