FILM THICKNESS MEASUREMENT

被引：0
|
作者：
SELLARS, IC
机构：
来源：
ANTI-CORROSION METHODS AND MATERIALS | 1976年 / 23卷 / 04期
关键词：
D O I：
暂无
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
收藏
页码：18 / 20
页数：3
相关论文
共 50 条
  • [41] MEASUREMENT OF FILM THICKNESS BY X-RAYS
    MEYER, TO
    SOONPAA, HH
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1968, 13 (03): : 491 - &
  • [42] Measurement of liquid film thickness by a fringe method
    Kariyasaki, Akira
    Yamasaki, Yoshikazu
    Kagawa, Masazumi
    Nagashima, Tohru
    Ousaka, Akiharu
    Morooka, Shigeharu
    HEAT TRANSFER ENGINEERING, 2009, 30 (1-2) : 28 - 36
  • [43] MEASUREMENT OF FILM THICKNESS USING INFRARED INTERFERENCE
    DUMIN, DJ
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1967, 38 (08): : 1107 - &
  • [44] NOTE ON SILICON OXIDE FILM THICKNESS MEASUREMENT
    ROBERTSON, HM
    MCNAMARA, JE
    WARNER, RM
    JOURNAL OF APPLIED PHYSICS, 1962, 33 (09) : 2909 - &
  • [45] Fast liquid film thickness measurement technique
    Cederquist, SC
    MATERIALS PERFORMANCE, 2000, 39 (07) : 15 - 15
  • [46] STANDARDIZED FILM THICKNESS MEASUREMENT TECHNIQUE.
    Henderson, Gary O.
    Semiconductor International, 1985, 8 (09) : 170 - 173
  • [47] On-line oil film thickness measurement
    AMEPA GmbH, Aachen, Germany
    不详
    Iron Steel Technol., 2008, 1 (75-81):
  • [48] In Situ Measurement of Fluid Film Thickness in Machining
    Chihyung Huang
    Seongeyl Lee
    John P. Sullivan
    Srinivasan Chandrasekar
    Tribology Letters, 2007, 28 : 39 - 44
  • [49] Measurement of material thickness in the presence of a protective film
    Ramamurthy, Rajesh
    Harding, Kevin
    DIMENSIONAL OPTICAL METROLOGY AND INSPECTION FOR PRACTICAL APPLICATIONS VI, 2017, 10220
  • [50] MEASUREMENT OF FILM THICKNESS BY ELECTRON MICROPROBE ANALYZER
    CHOPRA, KL
    RANDLETT, MR
    BENDER, SL
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (11): : 1755 - &
12345