ATOMIC-FORCE MICROSCOPY AND HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPY STUDY OF THE BANDED SURFACE-MORPHOLOGY OF HYDROXYPROPYLCELLULOSE THIN-FILMS

被引：29
|
作者：
PATNAIK, SS [1 ]
BUNNING, TJ [1 ]
ADAMS, WW [1 ]
WANG, J [1 ]
LABES, MM [1 ]
机构：
[1] TEMPLE UNIV, DEPT CHEM, PHILADELPHIA, PA 19122 USA
来源：
MACROMOLECULES | 1995年 / 28卷 / 01期
关键词：
D O I：
10.1021/ma00105a058
中图分类号：
O63 [高分子化学（高聚物）];
学科分类号：
070305 ; 080501 ; 081704 ;
摘要：
[No abstract available]
引用
收藏
页码：393 / 395
页数：3
相关论文
共 50 条
  • [1] CHARACTERIZATION OF THE SURFACE-MORPHOLOGY OF DIBLOCK COPOLYMERS VIA LOW-VOLTAGE, HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPY AND ATOMIC FORCE MICROSCOPY
    SCHWARK, DW
    VEZIE, DL
    REFFNER, JR
    THOMAS, EL
    ANNIS, BK
    [J]. JOURNAL OF MATERIALS SCIENCE LETTERS, 1992, 11 (06) : 352 - 355
  • [2] ATOMIC-FORCE MICROSCOPY SURFACE-MORPHOLOGY STUDIES OF IN-SITU DEPOSITED POLYANILINE THIN-FILMS
    AVLYANOV, JK
    JOSEFOWICZ, JY
    MACDIARMID, AG
    [J]. SYNTHETIC METALS, 1995, 73 (03) : 205 - 208
  • [3] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF AMORPHOUS THIN-FILMS
    HOWIE, A
    [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1978, 31 (1-2) : 41 - 55
  • [4] HIGH-RESOLUTION ELECTRON-MICROSCOPY FOR THIN-FILMS AND SURFACES
    MIHAMA, K
    [J]. JOURNAL OF ELECTRON MICROSCOPY, 1983, 32 (01): : 67 - 67
  • [5] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF AMORPHOUS THIN-FILMS
    HOWIE, A
    [J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (03): : 465 - 465
  • [6] DIRECT IMAGING OF UNCOATED POLYMER SURFACE-MORPHOLOGY WITH HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPY
    KRAUSE, SJ
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1990, 200 : 64 - IEC
  • [7] SCANNING ELECTRON-MICROSCOPY AND ATOMIC-FORCE MICROSCOPY OF ALKANETHIOL MONOLAYERS ON GOLD
    ROLANDI, R
    CAVALLERI, O
    TONEATTO, C
    RICCI, D
    [J]. THIN SOLID FILMS, 1994, 243 (1-2) : 431 - 436
  • [8] SURFACE-MORPHOLOGY AND ROUGHNESS OF TIO2 THIN-FILMS INVESTIGATED WITH SCANNING FORCE MICROSCOPY
    GUTMANNSBAUER, W
    HAEFKE, H
    RUETSCHI, M
    GUNTHERODT, HJ
    STAUB, J
    BANGE, K
    [J]. HELVETICA PHYSICA ACTA, 1993, 66 (7-8): : 877 - 878
  • [9] CHARACTERIZATION OF THIN-FILMS, INTERFACES AND SURFACES BY HIGH-RESOLUTION ELECTRON-MICROSCOPY
    SMITH, DJ
    LI, ZG
    LU, P
    MCCARTNEY, MR
    TSEN, SCY
    [J]. ULTRAMICROSCOPY, 1991, 37 (1-4) : 169 - 179
  • [10] RECENT STUDIES OF THIN-FILMS AND SURFACES BY HIGH-RESOLUTION ELECTRON-MICROSCOPY
    SMITH, DJ
    GLAISHER, RW
    LI, ZG
    LU, P
    MCCARTNEY, MR
    TSEN, SCY
    DATYE, AK
    [J]. METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1992, 23 (04): : 1063 - 1070
12345