CHARACTERIZATION OF THE SURFACE-MORPHOLOGY OF DIBLOCK COPOLYMERS VIA LOW-VOLTAGE, HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPY AND ATOMIC FORCE MICROSCOPY

被引：41

作者：

SCHWARK, DW ^{[1
]}

VEZIE, DL ^{[1
]}

REFFNER, JR ^{[1
]}

THOMAS, EL ^{[1
]}

ANNIS, BK ^{[1
]}

机构：

[1] OAK RIDGE NATL LAB,DIV CHEM,OAK RIDGE,TN 37831

来源：

JOURNAL OF MATERIALS SCIENCE LETTERS | 1992年 / 11卷 / 06期

关键词：

D O I：

10.1007/BF00729180

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

页码：352 / 355

页数：4

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