SCANNING LOW-ENERGY ELECTRON LOSS MICROSCOPY (SLEELM) - AU ON SI

被引：11
|
作者：
ELGOMATI, MM [1 ]
MATTHEW, JAD [1 ]
机构：
[1] UNIV YORK,DEPT PHYS,YORK YO1 5DD,N YORKSHIRE,ENGLAND
来源：
APPLIED SURFACE SCIENCE | 1988年 / 32卷 / 03期
关键词：
Compendex;
D O I：
10.1016/0169-4332(88)90017-7
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
MICROSCOPIC EXAMINATION - Scanning Electron Microscopy - SPECTROSCOPY, ELECTRON - SURFACES - Spectroscopic Analysis
引用
收藏
页码：320 / 331
页数：12
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