ON THERMAL QUENCHING OF THE PHOTOCONDUCTIVITY IN HYDROGENATED AMORPHOUS-SILICON

被引:48
|
作者
TRAN, MQ
机构
[1] UNIV CHICAGO,DEPT PHYS,CHICAGO,IL 60637
[2] UNIV CHICAGO,JAMES FRANCK INST,CHICAGO,IL 60637
基金
美国国家科学基金会;
关键词
D O I
10.1080/13642819508239062
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thermal quenching (TQ) of the photoconductivity sigma(p) is the decrease in sigma(p) with increasing temperature. We present an explanation for TQ of sigma(p) usually observed above 100 K in undoped and weakly doped hydrogenated amorphous silicon (a-Si:H). With computer simulations employing the theory of Simmons and Taylor, we show that TQ is caused by the natural density of gap states of a-Si:H. The onset of thermal quenching occurs at the temperature T-TQ where the trapped hole density in the valence band tail has decreased to twice the density N-D of dangling bonds. We elucidate the experimental observation that T-TQ shifts to lower temperatures as the Fermi level shifts toward the valence band or as N-D is increased and explain the reported superlinear dependence of the inverse photoconductivity sigma(p)(-1) on N-D. We test and discuss the validity of the Simmons-Taylor theory by comparing the simulated and experimental temperature dependences of the Rose exponent gamma, which relates the photoconductivity and the generation rate.
引用
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页码:35 / 66
页数:32
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