X-RAY PENDELLOSUNG INTERFERENCE IN GARNET EPITAXIAL LAYERS

被引：0
|
作者：
STACY, WT [1 ]
JANSSEN, MM [1 ]
机构：
[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
来源：
ACTA CRYSTALLOGRAPHICA SECTION A | 1975年 / 31卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：S212 / S212
页数：1
相关论文
共 50 条
  • [41] X-RAY TOPOGRAPHY AND DIFFRACTOMETRY OF CDXHG1-XTE EPITAXIAL LAYERS
    BROWN, GT
    KEIR, AM
    GIESS, J
    GOUGH, JS
    IRVINE, SJC
    [J]. MICROSCOPY OF SEMICONDUCTING MATERIALS 1989, 1989, 100 : 457 - 465
  • [42] ON POSSIBILITY OF EXPERIMENTAL OBSERVATION OF STRUCTURE OF EPITAXIAL LAYERS BY MEANS OF X-RAY DIFFRACTIONS
    LUBY, S
    SCHILDER, J
    [J]. CESKOSLOVENSKY CASOPIS PRO FYSIKU SEKCE A, 1968, 18 (04): : 378 - &
  • [43] Structural perfection of GaN epitaxial layers according to x-ray diffraction measurements
    Kyutt, RN
    Ratnikov, VV
    Mosina, GN
    Shcheglov, MP
    [J]. PHYSICS OF THE SOLID STATE, 1999, 41 (01) : 25 - 31
  • [44] X-Ray Diffraction and Photoreflectance Study of CuGaSe2 Epitaxial Layers
    Tanaka, Masahiro
    Kodama, Tomohiro
    Nabetani, Yoichi
    Kato, Takamasa
    Matsumoto, Takashi
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2000, 39 (01) : 203 - 204
  • [45] X-ray investigation of thick epitaxial GaAs/InGaAs layers on Ge pseudosubstrates
    Khan, AR
    Mundboth, K
    Stangl, J
    Bauer, G
    von Känel, H
    Fedorov, A
    Isella, G
    Colombo, D
    [J]. IEEE: 2005 International Conference on Emerging Technologies, Proceedings, 2005, : 323 - 328
  • [46] ASSESSMENT OF MISMATCHED EPITAXIAL LAYERS BY X-RAY ROCKING CURVE MEASUREMENTS AND SIMULATIONS
    HERRES, N
    BENDER, G
    NEUMANN, G
    [J]. APPLIED SURFACE SCIENCE, 1991, 50 (1-4) : 97 - 102
  • [47] X-ray diffuse scattering from threading dislocations in epitaxial GaN layers
    Barchuk, M.
    Holy, V.
    Miljevic, B.
    Krause, B.
    Baumbach, T.
    Hertkorn, J.
    Scholz, F.
    [J]. JOURNAL OF APPLIED PHYSICS, 2010, 108 (04)
  • [48] Diffuse x-ray scattering from correlated dislocations in epitaxial layers.
    Holy, Vaclav
    [J]. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2010, 66 : S213 - S214
  • [49] On the Use of an External Reference Sample in the X-ray Diffraction Analysis of Epitaxial Layers
    Drozdov, Yu N.
    Yunin, P. A.
    [J]. JOURNAL OF SURFACE INVESTIGATION, 2016, 10 (01): : 96 - 100
  • [50] STRUCTURE FACTORS OF ICE CRYSTAL DETERMINED BY THE X-RAY PENDELLOSUNG METHOD
    YASUDA, Y
    HONDOH, T
    HIGASHI, A
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1979, 18 (09) : 1845 - 1846
12345