RELIABILITY OF ELECTRONIC COMPONENTS .8. RELIABILITY PROBLEMS WITH SEMICONDUCTOR MEMORIES AND MICROPROCESSORS

被引：0
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作者：
BAJENESCU, TI
机构：
来源：
F&M-FEINWERKTECHNIK & MESSTECHNIK | 1982年 / 90卷 / 08期
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T [工业技术];
学科分类号：
08 ;
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页码：421 / 424
页数：4
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