INFRARED REFLECTION SPECTRA OF HG1-XZNXTE CRYSTALS

被引：0
|
作者：
WU, CC
CHU, DY
SUN, CY
机构：
[1] Department of Electronic Engineering, National Taiwan Institute of Technology, Taipei
来源：
MATERIALS RESEARCH BULLETIN | 1995年 / 30卷 / 09期
关键词：
MERCURY-ZINC-TELLURIDE; MERCURY-TELLURIDE; ZINC-TELLURIDE;
D O I：
10.1016/0025-5408(95)00097-6
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Hg1-xZnxTe crystals were grown by the traveling heater method. The composition and crystalline quality of ingots were analyzed by electrolyte electroreflectance experiment. The far-infrared reflection spectra of Hg1-xZnxTe crystals with various composition x were measured at temperatures ranging from 90 K to 295 K in the wavenumber region of 60 to 450 cm(-1). In all but the pure compounds, HgTe and ZnTe, a two TO phonon structure was clearly observed. The optical phonon frequencies were well-determined by both the Kramers-Kronig integrations and the dynamic dielectric function fitting, and their temperature dependence is discussed.
引用
收藏
页码：1097 / 1105
页数：9
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