Plane-wave images of microdefects in the crystals with the periodic deformation fields

被引：0
|
作者：
Raranskii, ND [1 ]
Fodchuk, IM [1 ]
Korovyanko, OZ [1 ]
Slipchenko, KV [1 ]
机构：
[1] CHERNOVTSY STATE UNIV,CHERNOVTSY 274012,UKRAINE
来源：
METALLOFIZIKA I NOVEISHIE TEKHNOLOGII | 1995年 / 17卷 / 06期
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D O I：
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中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
An influence of ultrasound-X-ray interaction on the contrast of the microdefects images in the X-ray topograms has been investigated over the intermediate range of depthes (provided mu t > 3). It is shown that the interval of revealed dimensions of small inclusions extends substantially if the ultrasound wave-length is equal to the extinction length. Analytical relationships describing the details of gaining and softening contrasts for the kinematic component of the image are derived.
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页码：58 / 62
页数：5
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