SCANNING TUNNELING SPECTROSCOPY ON SI

被引：5
|
作者：
NEDDERMEYER, H
TOSCH, S
机构：
来源：
ULTRAMICROSCOPY | 1988年 / 25卷 / 02期
关键词：
D O I：
10.1016/0304-3991(88)90221-5
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：135 / 147
页数：13
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