RELIABILITY-ANALYSIS OF REPAIRABLE AND NON-REPAIRABLE SYSTEMS WITH COMMON-CAUSE FAILURES

被引：4
|
作者：
CHUNG, WK
机构：
[1] Univ of Ottawa, Canada
来源：
MICROELECTRONICS AND RELIABILITY | 1989年 / 29卷 / 04期
关键词：
Failure Analysis - Probability - Systems Engineering--Redundancy;
D O I：
10.1016/0026-2714(89)90343-0
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents a reliability analysis of repairable and non-repairable systems with N active redundant units, r repair facilities and common-cause failures. The system is in a failed state when all N active units have failed or by a common-cause failure. The rate of common-cause failure is dependent on the number of failed units. Laplace transforms of state probabilities and mean time to failure of the system are derived.
引用
收藏
页码：545 / 547
页数：3
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