TRANSMISSION ELECTRON-MICROSCOPY STUDY OF THE PASSIVE FILMS ON NICKEL

被引：0
|
作者：
TJONG, SC
机构：
来源：
JOURNAL OF MATERIALS SCIENCE LETTERS | 1984年 / 3卷 / 10期
关键词：
D O I：
10.1007/BF00719567
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：845 / 846
页数：2
相关论文
共 50 条
  • [21] TRANSMISSION ELECTRON-MICROSCOPY OF INSITU DEPOSITED FILMS ON SILICON
    GIBSON, JM
    BATSTONE, JL
    LANZEROTTI, MY
    EVALUATION OF ADVANCED SEMICONDUCTOR MATERIALS BY ELECTRON MICROSCOPY, 1989, 203 : 295 - 304
  • [22] TRANSMISSION ELECTRON-MICROSCOPY OF MOLECULAR THIN-FILMS
    WRIGHT, AC
    LUK, S
    WILLIAMS, JO
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 301 - 302
  • [23] ANALYTICAL TRANSMISSION ELECTRON-MICROSCOPY OF THIN-FILMS
    GEISS, RH
    HUANG, TC
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 140 - 143
  • [24] TRANSMISSION ELECTRON-MICROSCOPY OF MOLECULAR THIN-FILMS
    WRIGHT, AC
    LUK, S
    WILLIAMS, JO
    EUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY, 1988, 93 : 301 - 302
  • [25] TRANSMISSION ELECTRON-MICROSCOPY STUDIES ON THE LATERAL GROWTH OF NICKEL SILICIDES
    CHEN, SH
    ZHENG, LR
    CARTER, CB
    MAYER, JW
    JOURNAL OF APPLIED PHYSICS, 1985, 57 (02) : 258 - 263
  • [26] A SCANNING ELECTRON-MICROSCOPY TRANSMISSION ELECTRON-MICROSCOPY STUDY OF THE PHOTOCRYSTALLIZATION OF AMORPHOUS-SILICON
    PRASAD, A
    EBIHARA, K
    JOHN, PK
    TONG, BY
    WONG, SK
    CHIK, KP
    JOURNAL OF APPLIED PHYSICS, 1983, 54 (10) : 5760 - 5763
  • [27] Transmission electron microscopy study of epitaxial passive oxide films on nanoparticles of metals
    K K FUNG (Department of Physics
    电子显微学报, 2002, (03) : 247 - 252
  • [28] NECROTAXIS - SCANNING AND TRANSMISSION ELECTRON-MICROSCOPY STUDY
    VETHAMANY, VG
    VETHAMANY, SK
    BESSIS, M
    NOUVELLE REVUE FRANCAISE D HEMATOLOGIE, 1975, 15 (01): : 83 - 98
  • [29] STUDY OF MODULATED STRUCTURES BY TRANSMISSION ELECTRON-MICROSCOPY
    STEEDS, JW
    BIRD, DM
    EAGLESHAM, DJ
    MCKERNAN, S
    VINCENT, R
    WITHERS, RL
    ULTRAMICROSCOPY, 1985, 18 (1-4) : 97 - 110
  • [30] TRANSMISSION ELECTRON-MICROSCOPY STUDY OF CRACK TIPS
    HOCKEY, BJ
    JOURNAL OF METALS, 1980, 32 (12): : 75 - 75
12345