CAPACITANCE/VOLTAGE CHARACTERISTICS OF SEMICONDUCTOR-INSULATOR-SEMICONDUCTOR (SIS) STRUCTURE

被引：1
|
作者：
NAGAI, K
HAYASHI, Y
SEKIGAWA, T
机构：
来源：
ELECTRONICS LETTERS | 1983年 / 19卷 / 10期
关键词：
D O I：
10.1049/el:19830260
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：376 / 377
页数：2
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