X-RAY SYSTEM APPLICATIONS USING REVERSE GEOMETRY FOR HIGH-SENSITIVITY

被引：0
|
作者：
ALBERT, TM
机构：
来源：
MATERIALS EVALUATION | 1993年 / 51卷 / 09期
关键词：
422.1 Test Equipment - 423.2 Test Methods - 715 Electronic Equipment; General Purpose and Industrial - 723.5 Computer Applications - 741.3 Optical Devices and Systems;
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
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页码：1020 / 1023
页数：4
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