SECONDARY-ELECTRON SPECTROSCOPY AND IMAGE-RESOLUTION IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE

被引：0
|
作者：
BLELOCH, AL
机构：
来源：
INSTITUTE OF PHYSICS CONFERENCE SERIES | 1990年 / 98期
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D O I：
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中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
A simple secondary electron (SE) spectrometer has been designed and implemented on a VG Microscopes HB5 dedicated STEM. It is shown that the high resolution images are indeed formed by SEs with energies of a few electron volts. Simple estimates of interaction localization are shown to be consistent with this resolution for most of the relevant interactions. However, the observed resolution favours a larger contribution from the more localized core excitations than is theroretically predicted.
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页码：469 / 472
页数：4
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