STRUCTURE DEPENDENT FAR-INFRARED PROPERTIES OF BAF2 OPTICAL FILMS

被引：7
|
作者：
LEHMANN, A
MUTSCHKE, H
机构：
[1] Institut Für Festkörperphysik, Friedrich-Schiller-Universität, Jena
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1991年 / 125卷 / 01期
关键词：
D O I：
10.1002/pssa.2211250134
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
From IR spectra of BaF2 films a shift of the zero point of the real part of the IR dielectric function with film thickness is deduced. While for an about 50 nm thick layer this zero point appears at the same frequency as for bulk material much thicker layers show remarkable shifts to smaller frequencies. This may be correlated to a lowering of the packing density of the evaporated films with thickness.
引用
收藏
页码：363 / 368
页数：6
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