ANALOG FAULT-DIAGNOSIS WITH FAILURE BOUNDS

被引：0

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作者：

WU, CC

NAKAJIMA, K

WEY, CL

SAEKS, R

机构：

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS | 1982年 / 29卷 / 05期

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中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

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页码：277 / 284

页数：8

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