A BOND BREAKING MODEL FOR SECONDARY ION EMISSION

被引:0
|
作者
YU, ML
机构
关键词
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:542 / 548
页数:7
相关论文
共 50 条
  • [41] Breaking the bond
    Andrea Du Toit
    Nature Reviews Microbiology, 2023, 21 : 1 - 1
  • [42] Breaking the bond
    Kochan, A
    ASSEMBLY AUTOMATION, 2003, 23 (01) : 36 - 37
  • [43] DIATOMIC VERSUS ATOMIC SECONDARY ION EMISSION
    WITTMAACK, K
    STAUDENMAIER, G
    APPLIED PHYSICS LETTERS, 1975, 27 (06) : 318 - 320
  • [44] ISOTOPE EFFECTS IN SECONDARY-ION EMISSION
    GNASER, H
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1989, 109 (1-4): : 265 - 271
  • [45] SECONDARY EMISSION FROM MERCURY ION BOMBARDMENT
    JOHANSSON, R
    VARNEY, RN
    ARKIV FOR FYSIK, 1960, 16 (06): : 502 - 502
  • [46] TRANSFER OPTICS FOR MICROANALYSIS BY SECONDARY ION EMISSION
    SLODZIAN, G
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1978, 3 (05): : 447 - 449
  • [47] SECONDARY ION EMISSION MICROANALYSIS - BIOMEDICAL APPLICATIONS
    GALLE, P
    LEFEVRE, R
    MICROSCOPICA ACTA, 1978, : 341 - 354
  • [48] SECONDARY-ION EMISSION PROBABILITY IN SPUTTERING
    NORSKOV, JK
    LUNDQVIST, BI
    PHYSICAL REVIEW B, 1979, 19 (11): : 5661 - 5665
  • [49] AODO: Secondary ion emission and surface modification
    Akcoeltekin, S.
    Alzaher, I.
    d'Etat, B. Ban
    Been, T.
    Boduch, P.
    Cassimi, A.
    Hijazi, H.
    Lebius, H.
    Manil, B.
    Ramillon, J. M.
    Rothard, H.
    Schleberger, M.
    da Silveira, E. F.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2009, 267 (04): : 649 - 651
  • [50] MASS SPECTROGRAPHY WITH SECONDARY ION EMISSION SOURCE
    HERNANDE.R
    LANUSSE, P
    SLODZIAN, G
    VIDAL, G
    RECHERCHE AEROSPATIALE, 1972, 4 (06): : 313 - 324