AUTOMATED CONTACT RESISTANCE PROBE

被引:11
|
作者
ANTLER, M
AULETTA, LV
CONLEY, J
机构
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 1963年 / 34卷 / 12期
关键词
D O I
10.1063/1.1718226
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:1317 / &
相关论文
共 50 条
  • [1] AUTOMATED PROBE CONTACT FOR SUBASSEMBLY TEST.
    Askew, J.C.
    Daniels, G.W.
    Pilger, W.W.
    IBM technical disclosure bulletin, 1983, 26 (04): : 1882 - 1883
  • [2] A MAGNETICALLY LEVITATED, AUTOMATED, CONTACT ANALYTICAL PROBE TOOL
    CHEN, SJS
    BUSCHVISHNIAC, IJ
    IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 1995, 8 (01) : 72 - 78
  • [3] IMPROVED PROBE APPARATUS FOR MEASURING CONTACT RESISTANCE
    CHAIKIN, SW
    ANDERSON, JR
    SANTOS, GJ
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1961, 32 (12): : 1294 - &
  • [4] Measurement and analysis of contact resistance in wafer probe testing
    Liu, D. S.
    Shih, M. K.
    Huang, W. H.
    MICROELECTRONICS RELIABILITY, 2007, 47 (07) : 1086 - 1094
  • [5] AUTOMATED TESTER FOR CONTACT ELECTRIC-RESISTANCE MEASUREMENTS
    PLATONOV, BM
    POLUKAROV, YM
    INDUSTRIAL LABORATORY, 1986, 52 (04): : 350 - 351
  • [6] A MODEL OF METAL-SEMICONDUCTOR CONTACT IN SPREADING RESISTANCE PROBE
    KEENAN, WA
    SCHUMANN, PA
    PHILLIPS, RP
    TONG, AH
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1968, 115 (11) : C323 - &
  • [7] INFLUENCE OF SOME GEOMETRIC FACTORS ON CONTACT RESISTANCE PROBE MEASUREMENTS
    PINNEL, MR
    BRADFORD, KF
    IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1980, 3 (01): : 159 - 165
  • [8] Development of an automated relay meter measuring contact resistance of rails
    Hrbac, Roman
    Kolar, Vaclav
    Mlcak, Tomas
    PROCEEDINGS OF THE 12TH INTERNATIONAL SCIENTIFIC CONFERENCE ELECTRIC POWER ENGINEERING 2011, 2011, : 274 - 277
  • [9] Effect of probe contact resistance on precision measurements of sheet resistance of metallized thin films
    Yu, KM
    Kim, KJ
    Cheon, RJ
    Kang, JH
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 1999, 34 : S347 - S349
  • [10] Measuring the Thermal Contact Resistance of a Junction by T Type Probe Method
    Wang, Jianli
    Gu, Ming
    Zhang, Xing
    MNHMT2009, VOL 2, 2010, : 427 - 434