OXYGEN K-EDGE NEXAFS STUDIES OF THIN CS OXIDE-FILMS

被引：4
|
作者：
PEDIO, M
BENFATTO, M
AMINPIROOZ, S
HAASE, J
机构：
[1] IST NAZL FIS NUCL, LAB NAZL FRASCATI, I-00044 FRASCATI, ITALY
[2] MAX PLANCK GESELL, FRITZ HABER INST, W-1000 BERLIN 33, GERMANY
来源：
SURFACE SCIENCE | 1992年 / 269卷
关键词：
D O I：
10.1016/0039-6028(92)91334-8
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Near-edge X-ray absorption fine structure (NEXAFS) studies of oxygen interaction with thin films of polycristalline cesium show the evolution of different Cs oxides with increasing oxygen exposure. Multiple scattering calculations indicate that the system prepared by co-deposition of Cs and oxygen at 120 K has a CsO2 structure and that the resonance at about 537 eV corresponds to scattering events involving the oxygen in the O2- form with an O-O bond length of 1.40+/-0.05 angstrom.
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页码：691 / 694
页数：4
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