TRANSMISSION ELECTRON-MICROSCOPY STUDIES ON LATERAL REACTION OF GAAS WITH NI

被引：13
|
作者：
CHEN, SH
CARTER, CB
PALMSTROM, CJ
OHASHI, T
机构：
[1] CORNELL UNIV,DEPT MAT SCI & ENGN,ITHACA,NY 14853
[2] CORNELL UNIV,SCH ELECT ENGN,ITHACA,NY 14853
来源：
APPLIED PHYSICS LETTERS | 1986年 / 48卷 / 12期
关键词：
D O I：
10.1063/1.96675
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：803 / 805
页数：3
相关论文
共 50 条
  • [41] COMPARATIVE STUDIES OF DEFECTS IN GAAS ON SILICON SUBSTRATES USING ELECTRON-BEAM-INDUCED CURRENT AND TRANSMISSION ELECTRON-MICROSCOPY
    HUMPHREYS, TP
    HAMAGUCHI, N
    BEDAIR, SM
    TARN, JCL
    ELMASRY, N
    RADZIMSKI, ZJ
    JOURNAL OF APPLIED PHYSICS, 1988, 64 (07) : 3763 - 3765
  • [42] TRANSMISSION ELECTRON-MICROSCOPY OF ELECTRODEPOSITS
    GIANNUZZI, LA
    HOWELL, PR
    PICKERING, HW
    BITLER, WR
    JOURNAL OF ELECTRONIC MATERIALS, 1993, 22 (06) : 639 - 644
  • [43] TRANSMISSION ELECTRON-MICROSCOPY OF CATALYSTS
    SANDERS, JV
    JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1986, 3 (01): : 67 - 93
  • [44] TRANSMISSION ELECTRON-MICROSCOPY OF POLYAMIDES
    MARTINEZSALAZAR, J
    CANNON, CG
    JOURNAL OF MATERIALS SCIENCE LETTERS, 1984, 3 (08) : 693 - 694
  • [45] PRINCIPLES OF TRANSMISSION ELECTRON-MICROSCOPY
    BUSECK, PR
    REVIEWS IN MINERALOGY, 1992, 27 : 1 - 36
  • [46] TRENDS IN TRANSMISSION ELECTRON-MICROSCOPY
    DELONG, A
    DRAHOS, V
    CESKOSLOVENSKY CASOPIS PRO FYSIKU SEKCE A, 1975, 25 (01): : 14 - 27
  • [47] HOLOGRAPHY AND TRANSMISSION ELECTRON-MICROSCOPY
    MATTEUCCI, G
    POZZI, G
    TONOMURA, A
    JOURNAL DE PHYSIQUE IV, 1993, 3 (C7): : 2063 - 2072
  • [48] FUNDAMENTALS OF TRANSMISSION ELECTRON-MICROSCOPY
    不详
    MEMOIRES SCIENTIFIQUES DE LA REVUE DE METALLURGIE, 1965, 62 (03): : 255 - &
  • [49] TRANSMISSION ELECTRON-MICROSCOPY AND SCANNING ELECTRON-MICROSCOPY STUDIES OF HYDROGEN EFFECTS IN COPPER AND CU-AL ALLOYS
    KIM, JJ
    BYRNE, JG
    MATERIALS SCIENCE AND ENGINEERING, 1985, 76 (1-2): : 181 - 185
  • [50] TRANSMISSION ELECTRON-MICROSCOPY OF OXIDIZED NI-CR-AL ALLOYS
    SMIALEK, JL
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1978, 125 (03) : C113 - C113
12345