ON THE INSTRUMENTAL AND ATMOSPHERIC STRAY-LIGHT FOR SOLAR OBSERVATIONS

被引:15
|
作者
MATTIG, W
机构
关键词
D O I
10.1007/BF00151169
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
引用
收藏
页码:187 / 193
页数:7
相关论文
共 50 条
  • [11] EXPOSURE CONTROL AND STRAY-LIGHT COMPONENT
    HARRIS, JW
    JOURNAL OF THE SOCIETY OF MOTION PICTURE TELEVISION ENGINEERS, 1965, 74 (07): : 587 - &
  • [12] EXPOSURE CONTROL AND STRAY-LIGHT COMPONENT
    HARRIS, JW
    JOURNAL OF THE SMPTE-SOCIETY OF MOTION PICTURE AND TELEVISION ENGINEERS, 1965, 74 (07): : 587 - 589
  • [13] Modeling the JANUS stray-light behavior
    Greggio, D.
    Munari, M.
    Magrin, D.
    Paolinetti, R.
    Barilli, M.
    Turella, A.
    Zusi, M.
    Della Corte, V.
    Palumbo, P.
    Mugnuolo, R.
    Amoroso, M.
    Castronuovo, M.
    Ragazzoni, R.
    SPACE TELESCOPES AND INSTRUMENTATION 2018: OPTICAL, INFRARED, AND MILLIMETER WAVE, 2018, 10698
  • [14] Stray-light correction algorithm for spectrographs
    Brown, SW
    Johnson, BC
    Feinholz, ME
    Yarbrough, MA
    Flora, SJ
    Lykke, KR
    Clark, DK
    METROLOGIA, 2003, 40 (01) : S81 - S84
  • [15] ANALYSIS OF UNCERTAINTIES IN STRAY-LIGHT CORRECTION
    Zong, Yuqin
    PROCEEDINGS OF THE CIE EXPERT SYMPOSIUM ON SPECTRAL AND IMAGING METHODS FOR PHOTOMETRY AND RADIOMETRY, 2010, : 50 - 54
  • [16] Stray-light analyses of the multielement telescope for imaging and spectroscopy coronagraph on Solar Orbiter
    Sandri, Paolo
    Fineschi, Silvano
    Romoli, Marco
    Taccola, Matteo
    Landini, Federico
    Da Deppo, Vania
    Naletto, Giampiero
    Morea, Danilo
    Naughton, Denis
    Antonucci, Ester
    OPTICAL ENGINEERING, 2018, 57 (01)
  • [18] Contamination scatter functions for stray-light analysis
    Dittman, MG
    OPTICAL SYSTEM CONTAMINATION: EFFECTS, MEASUREMENTS, AND CONTROL VII, 2002, 4774 : 99 - 110
  • [19] TEST METHODS IN SPECTROPHOTOMETRY - STRAY-LIGHT DETERMINATION
    POULSON, RE
    APPLIED OPTICS, 1964, 3 (01): : 99 - &
  • [20] SIMPLE INFRARED TELESCOPE WITH STRAY-LIGHT REJECTION
    SHAFER, D
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1981, 304 : 171 - 175