RAMAN DETERMINATION OF STRUCTURES OF LONG-PERIOD SIC POLYTYPES

被引：17

作者：

NAKASHIMA, S ^{[1
]}

KISODA, K ^{[1
]}

GAUTHIER, JP ^{[1
]}

机构：

[1] UNIV LYON 1, MINERAL CRISTALLOG LAB, F-69622 VILLEURBANNE, FRANCE

来源：

JOURNAL OF APPLIED PHYSICS | 1994年 / 75卷 / 10期

关键词：

D O I：

10.1063/1.355738

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Raman spectroscopy has been applied to identification of longer-period SiC polytypes. The stacking structures of 5 1 R and 1 3 2R polytypes have been examined, the result of which is consistent with electron- and x-ray-diffraction analyses. The possibility is discussed for Raman determination of the period and stacking structure of longer period polytypes. It is demonstrated that Raman scattering is useful for the determination of the structure of SiC polytypes.

引用

页码：5354 / 5360

页数：7

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