MULTIPURPOSE COLLECTOR SYSTEM FOR A SCANNING ELECTRON-MICROSCOPE

被引：0

作者：

DYUKOV, VG ^{[1
]}

RAU, EI ^{[1
]}

SPIVAK, GV ^{[1
]}

SOLOVEV, AA ^{[1
]}

机构：

[1] MOSCOW STATE UNIV,PHYS FAC,MOSCOW,USSR

来源：

PRIBORY I TEKHNIKA EKSPERIMENTA | 1974年 / 05期

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：200 / 203

页数：4

共 50 条

[41] ELECTRON-MICROSCOPE GRID HOLDERS FOR A MULTIPURPOSE SPECIMEN STAGE
WARBLE, CE
REVIEW OF SCIENTIFIC INSTRUMENTS, 1983, 54 (05): : 607 - 610
[42] AN IMPROVED DETECTION SYSTEM FOR ELECTRICAL MICROCHARACTERIZATION IN A SCANNING ELECTRON-MICROSCOPE
LESNIAK, M
UNVALA, BA
HOLT, DB
JOURNAL OF MICROSCOPY-OXFORD, 1984, 135 (SEP): : 255 - 274
[43] TESTING OF PLASTICS WITH SCANNING ELECTRON-MICROSCOPE
SELL, J
KUNSTSTOFFE-PLASTICS, 1972, 19 (03): : 95 - &
[44] ELEMENTAL ANALYSIS IN THE SCANNING ELECTRON-MICROSCOPE
HEYWOOD, JA
AMERICAN LABORATORY, 1979, 11 (04) : 101 - &
[45] VIEWING OF INSULATORS IN A SCANNING ELECTRON-MICROSCOPE
SPIVAK, GV
SAPARIN, GV
ANDREYENKO, YA
BYKOV, MV
RADIO ENGINEERING AND ELECTRONIC PHYSICS-USSR, 1971, 16 (08): : 1416 - +
[46] FORENSIC APPLICATIONS OF SCANNING ELECTRON-MICROSCOPE
JUDD, G
SABO, J
FERRISS, S
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1974, : 12 - 12
[47] REPLICA TECHNIQUES FOR SCANNING ELECTRON-MICROSCOPE
NEVILLE, G
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (08): : 743 - &
[48] DIODE STRUCTURES IN A SCANNING ELECTRON-MICROSCOPE
GUBENKO, AY
BUTYLKINA, NA
LUKYANOV, AE
SPIVAK, GV
IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1974, 38 (11): : 2403 - 2408
[49] PLANT ULTRASTRUCTURE IN THE SCANNING ELECTRON-MICROSCOPE
BARNES, SH
BLACKMORE, S
SCANNING ELECTRON MICROSCOPY, 1986, 1986 : 281 - 289
[50] TYPICAL SCANNING ELECTRON-MICROSCOPE FRACTOGRAPHS
不详
METAL PROGRESS, 1978, 114 (03): : 39 - 43