Simulation study on short channel double-gate junctionless field-effect transistors

被引:9
|
作者
Wu, Meile [1 ]
Jin, Xiaoshi [1 ]
Chuai, Rongyan [1 ]
Liu, Xi [1 ]
Lee, Jong-Ho [2 ]
机构
[1] Shenyang Univ Technol, Sch Informat Sci & Engn, Shenyang 110870, Peoples R China
[2] Seoul Natl Univ, Sch EECS Eng & ISRC, Seoul 151742, South Korea
关键词
short channel effect; double-gate; junctionless field-effect transistor; device simulation;
D O I
10.1088/1674-4926/34/3/034004
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We study the characteristics of short channel double-gate (DG) junctionless (JL) FETs by device simulation. Output I-V characteristic degradations such as an extremely reduced channel length induced subthreshold slope increase and the threshold voltage shift due to variations of body doping and channel length have been systematically analyzed. Distributions of electron concentration, electric field and potential in the body channel region are also analyzed. Comparisons with conventional inversion-mode (IM) FETs, which can demonstrate the advantages of JL FETs, have also been performed.
引用
收藏
页数:8
相关论文
共 50 条
  • [1] Simulation study on short channel double-gate junctionless field-effect transistors
    吴美乐
    靳晓诗
    揣荣岩
    刘溪
    JongHo Lee
    [J]. Journal of Semiconductors, 2013, 34 (03) : 35 - 42
  • [2] Simulation study on short channel double-gate junctionless field-effect transistors
    吴美乐
    靳晓诗
    揣荣岩
    刘溪
    Jong-Ho Lee
    [J]. Journal of Semiconductors, 2013, (03) : 35 - 42
  • [3] A computational study of short-channel effects in double-gate junctionless graphene nanoribbon field-effect transistors
    Khalil Tamersit
    [J]. Journal of Computational Electronics, 2019, 18 : 1214 - 1221
  • [4] A computational study of short-channel effects in double-gate junctionless graphene nanoribbon field-effect transistors
    Tamersit, Khalil
    [J]. JOURNAL OF COMPUTATIONAL ELECTRONICS, 2019, 18 (04) : 1214 - 1221
  • [5] Semianalytical Model of the Subthreshold Current in Short-Channel Junctionless Symmetric Double-Gate Field-Effect Transistors
    Gnudi, Antonio
    Reggiani, Susanna
    Gnani, Elena
    Baccarani, Giorgio
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2013, 60 (04) : 1342 - 1348
  • [6] Short Channel Continuous Model for Double-Gate Junctionless Transistors
    Paz, Bruna Cardoso
    Pavanello, Marcelo Antonio
    Avila, Fernando
    Cerdeira, Antonio
    [J]. 2014 INTERNATIONAL CARIBBEAN CONFERENCE ON DEVICES, CIRCUITS AND SYSTEMS (ICCDCS), 2014,
  • [7] A compact model of subthreshold characteristics for short channel double-gate junctionless field effect transistors
    Jin, Xiaoshi
    Liu, Xi
    Chuai, Rongyan
    Lee, Jung-Hee
    Lee, Jong-Ho
    [J]. EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 2014, 65 (03):
  • [8] A unified analytical drain current model for Double-Gate Junctionless Field-Effect Transistors including short channel effects
    Raksharam
    Dutta, Aloke K.
    [J]. SOLID-STATE ELECTRONICS, 2017, 130 : 33 - 40
  • [9] Explicit drain current model of junctionless double-gate field-effect transistors
    Yesayan, Ashkhen
    Pregaldiny, Fabien
    Sallese, Jean-Michel
    [J]. SOLID-STATE ELECTRONICS, 2013, 89 : 134 - 138
  • [10] Charge-Based Modeling of Junctionless Double-Gate Field-Effect Transistors
    Sallese, Jean-Michel
    Chevillon, Nicolas
    Lallement, Christophe
    Iniguez, Benjamin
    Pregaldiny, Fabien
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2011, 58 (08) : 2628 - 2637