APPLICATIONS OF BUILT-IN-TEST EQUIPMENT WITHIN LARGE SYSTEMS

被引：1
|
作者：
MOORE, WR [1 ]
DAMPER, RI [1 ]
机构：
[1] UNIV SOUTHAMPTON,DEPT ELECTR & INFORMAT ENGN,SOUTHAMPTON SO9 5NH,HANTS,ENGLAND
来源：
IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS | 1986年 / 133卷 / 04期
关键词：
D O I：
10.1049/ip-g-1.1986.0036
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：221 / 226
页数：6
相关论文
共 50 条
  • [1] BUILT-IN-TEST TECHNOLOGY IN COMMERCIAL SYSTEMS
    LAMBERSON, LR
    SHAO, JJ
    [J]. 1989 INTERNATIONAL INDUSTRIAL ENGINEERING CONFERENCE & SOCIETIES MANUFACTURING AND PRODUCTIVITY SYMPOSIUM PROCEEDINGS, 1989, : 357 - 362
  • [2] ENHANCING MAINTAINABILITY OF AWG-10 THROUGH BUILT-IN-TEST EQUIPMENT
    CLOUD, EL
    [J]. IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS, 1967, AES3 (05) : 767 - &
  • [3] RELIABILITY MODEL OF COLD STANDBY SYSTEMS WITH BUILT-IN-TEST
    SHAO, JJ
    LAMBERSON, LR
    [J]. MICROELECTRONICS AND RELIABILITY, 1991, 31 (2-3): : 443 - 451
  • [4] ANALYSIS OF BUILT-IN-TEST ACCURACY
    GLEASON, D
    [J]. PROCEEDINGS ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM, 1982, (NSYM): : 370 - 372
  • [5] Reliability Analysis of Systems with Hybrid Recovery and Imperfect Built-in-Test
    Stepanyants, Armen
    Viktorova, Valentina
    [J]. DISTRIBUTED COMPUTER AND COMMUNICATION NETWORKS (DCCN 2019), 2019, 1141 : 413 - 423
  • [6] Embedded built-in-test detection circuit for radio frequency systems and circuits
    Zhang, Guoyan
    Farrell, Ronan
    [J]. PROCEEDINGS OF THE 2006 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, 2006, : 89 - +
  • [7] AN APPROACH TO THE SELECTION OF BUILT-IN-TEST DEVICES
    ROSIN, A
    [J]. PROCEEDINGS ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM, 1990, (SYM): : 346 - 350
  • [8] The research and development of built-in-test technology
    Pan, XH
    Jun, L
    Gang, C
    [J]. ISTM/2005: 6th International Symposium on Test and Measurement, Vols 1-9, Conference Proceedings, 2005, : 8975 - 8978
  • [9] DESIGN AND EVALUATION METHODOLOGY FOR BUILT-IN-TEST
    LORD, DH
    GLEASON, D
    [J]. IEEE TRANSACTIONS ON RELIABILITY, 1981, 30 (03) : 222 - 226
  • [10] Common Built-In-Test evaluation criteria
    Westervelt, K
    [J]. 2003 IEEE AEROSPACE CONFERENCE PROCEEDINGS, VOLS 1-8, 2003, : 3149 - 3156
12345