The research and development of built-in-test technology

被引：0
|
作者：
Pan, XH [1 ]
Jun, L [1 ]
Gang, C [1 ]
机构：
[1] Tianjin Univ Commerce, Sch Informat Engn, Tianjin 300134, Peoples R China
来源：
ISTM/2005: 6th International Symposium on Test and Measurement, Vols 1-9, Conference Proceedings | 2005年
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
During the last two decades Built-in-Test (BIT) has become an effective way to promote testability and maintainability of complex system. This thesis deals with intelligent BIT's concept and functions, its evolution and situation, and its development trends home and abroad.
引用
收藏
页码：8975 / 8978
页数：4
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