共 50 条
- [21] ON 4-PROBE METHOD OF RESISTIVITY MEASUREMENT JOURNAL OF SCIENTIFIC INSTRUMENTS, 1965, 42 (04): : 283 - &
- [22] DETERMINATION OF THE HALL-EFFECT AND MAGNETORESISTANCE OF CYLINDRICAL SEMICONDUCTOR SAMPLES BY THE 4-PROBE METHOD SOVIET PHYSICS SEMICONDUCTORS-USSR, 1980, 14 (09): : 1067 - 1068
- [23] DETERMINATION OF THE ELECTRICAL-CONDUCTIVITY OF SEMICONDUCTOR-FILMS BY A COMBINED 4-PROBE METHOD SOVIET PHYSICS SEMICONDUCTORS-USSR, 1978, 12 (10): : 1231 - 1232
- [24] RESISTIVITY CORRECTION FACTOR FOR THE 4-PROBE METHOD JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1987, 20 (12): : 1454 - 1456
- [25] 4-PROBE ELECTROMETER SYSTEM FOR RESISTIVITY MEASUREMENTS JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1985, 18 (07): : 568 - 570
- [26] ACCURACY OF 4-PROBE RESISTIVITY MEASUREMENTS ON SILICON BRITISH JOURNAL OF APPLIED PHYSICS, 1962, 13 (05): : 231 - &
- [27] 4-PROBE METHOD IN SURFACE-RESISTANCE MEASUREMENT FOR EPITAXIAL THIN-FILMS INDUSTRIAL LABORATORY, 1982, 48 (08): : 811 - 814
- [28] 4-PROBE METHODS TO MEASURE PIEZORESISTANCE CONSTANTS IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII FIZIKA, 1987, 30 (02): : 24 - 29
- [29] 4-PROBE INSTRUMENT FOR RESISTIVITY MEASUREMENTS OF GERMANIUM AND SILICON REVIEW OF SCIENTIFIC INSTRUMENTS, 1953, 24 (09): : 884 - 885