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- [1] APPLICATION OF 4-PROBE METHOD FOR MEASURING RESISTIVITY OF NONUNIFORM SEMICONDUCTOR MATERIALS MEASUREMENT TECHNIQUES-USSR, 1965, (05): : 427 - &
- [2] LOCALITY OF A 4-PROBE METHOD OF SEMICONDUCTOR RESISTANCE MEASUREMENT IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII FIZIKA, 1973, (10): : 39 - 43
- [3] MEASURING ELECTRICAL CONDUCTIVITY ANIZOTROPY OF SEMICONDUCTOR LAYERS BY 4-PROBE METHOD IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII FIZIKA, 1971, (08): : 143 - &
- [4] AUTOMATIC EQUIPMENT FOR MEASURING RESISTIVITY OF SEMICONDUCTOR INGOTS BY 4-PROBE METHOD MEASUREMENT TECHNIQUES-USSR, 1966, (07): : 959 - &
- [5] MEASURING CONDUCTIVITY AND HALL-COEFFICIENT OF SEMICONDUCTOR MONOCRYSTALS BY 4-PROBE METHOD IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1972, 36 (03): : 603 - &
- [6] 4-PROBE INSTRUMENT FOR MEASURING SPECIFIC ELECTRICAL RESISTIVITY OF CARBONACEOUS LUMP MATERIALS COKE & CHEMISTRY USSR, 1970, (07): : 25 - &
- [7] 4-PROBE MEASUREMENT OF CONDUCTIVITY OF INHOMOGENEOUS SEMICONDUCTOR LAYERS IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII FIZIKA, 1977, (07): : 30 - 33