UNIVERSAL CORRECTION PROCEDURE FOR ELECTRON-PROBE MICROANALYSIS .1. MEASUREMENT OF X-RAY DEPTH DISTRIBUTIONS IN SOLIDS

被引：60

|

作者：

SEWELL, DA

LOVE, G

SCOTT, VD

机构：

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1985年 / 18卷 / 07期

关键词：

D O I：

10.1088/0022-3727/18/7/010

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1233 / 1243

页数：11

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