KINEMATICAL INTERPRETATION OF AUGER-ELECTRON AND X-RAY PHOTOELECTRON DIFFRACTION FROM AG(110) SURFACE

被引：24

作者：

TAKAHASHI, S ^{[1
]}

KONO, S ^{[1
]}

SAKURAI, H ^{[1
]}

SAGAWA, T ^{[1
]}

机构：

[1] TOHOKU UNIV,FAC SCI,DEPT PHYS,SENDAI,MIYAGI 980,JAPAN

来源：

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1982年 / 51卷 / 10期

关键词：

D O I：

10.1143/JPSJ.51.3296

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：3296 / 3301

页数：6

共 50 条

[41] STUDY OF ELECTRONIC AND GEOMETRIC-PROPERTIES OF METAL ADSORBED SURFACES OF SILICON BY PHOTOELECTRON-SPECTROSCOPY AND X-RAY PHOTOELECTRON (AUGER-ELECTRON) DIFFRACTION
KONO, S
ARABIAN JOURNAL FOR SCIENCE AND ENGINEERING, 1990, 15 (2B): : 293 - 307
[42] AUGER-ELECTRON, X-RAY AND OPTICAL-EMISSIONS
TRBOJEVIC, D
TREADO, PA
LAMBERT, JM
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 10-1 (MAY): : 754 - 756
[43] ON AUGER-ELECTRON YIELD IN X-RAY INTERACTION WITH CRYSTALS
PASHAYEV, EM
PEREGUDOV, VN
IMAMOV, RM
FIZIKA TVERDOGO TELA, 1990, 32 (07): : 2094 - 2099
[44] AUGER-ELECTRON AND X-RAY PHOTOELECTRON SPECTROSCOPIC STUDY OF ELECTROCHEMICAL NICKEL-BORON FILMS
NOVOTORTSEVA, IG
GAEVSKAYA, TV
INORGANIC MATERIALS, 1995, 31 (08) : 969 - 973
[45] X-RAY PHOTOELECTRON AND SCANNING AUGER-ELECTRON SPECTROSCOPIC STUDIES OF OXIDIZED GRAPHITE ELECTRODE SURFACES
WANDASS, JH
GARDELLA, JA
WEINBERG, NL
BOLSTER, ME
SALVATI, L
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1987, 134 (11) : 2734 - 2739
[46] HIGH SPATIAL-RESOLUTION AUGER-ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON-SPECTROSCOPY
HANTSCHE, H
TRAC-TRENDS IN ANALYTICAL CHEMISTRY, 1989, 8 (06) : 215 - 222
[47] A STUDY OF ATOMIC IODINE AND MOLECULAR THALLIUM IODIDE BY X-RAY PHOTOELECTRON AND AUGER-ELECTRON SPECTROSCOPY
BANNA, MS
SLAUGHTER, AR
MATHEWS, RD
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1986, 40 (04) : 317 - 328
[48] AUGER-ELECTRON AND X-RAY PHOTOELECTRON SPECTROSCOPIC STUDY OF THE BIOCORROSION OF COPPER BY ALGINIC ACID POLYSACCHARIDE
JOLLEY, JG
GEESEY, GG
HANKINS, MR
WRIGHT, RB
WICHLACZ, PL
APPLIED SURFACE SCIENCE, 1989, 37 (04) : 469 - 480
[49] PRECISION, ACCURACY, AND UNCERTAINTY IN QUANTITATIVE SURFACE-ANALYSES BY AUGER-ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON-SPECTROSCOPY
POWELL, CJ
SEAH, MP
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (02): : 735 - 763
[50] X-RAY PHOTOELECTRON AND AUGER-ELECTRON SPECTROSCOPIC ANALYSIS OF SURFACE TREATMENTS AND ELECTROCHEMICAL DECOMPOSITION OF CUINSE2 PHOTOELECTRODES
CAHEN, D
IRELAND, PJ
KAZMERSKI, LL
THIEL, FA
JOURNAL OF APPLIED PHYSICS, 1985, 57 (10) : 4761 - 4771

← 1 2 3 4 5 →