ABUSE TESTING TAKES INSTRUMENTS TO THEIR LIMITS AND BEYOND

被引：0

作者：

JUNEAU, M ^{[1
]}

机构：

[1] HEWLETT PACKARD CO,DIV INSTRUMENT,LOVELAND,CO 80537

来源：

EDN MAGAZINE-ELECTRICAL DESIGN NEWS | 1977年 / 22卷 / 08期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：97 / 101

页数：5

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