HIGH RELIABILITY PHOTODIODES FOR SPACE APPLICATIONS

被引：0
|
作者：
BRILMAN, M [1 ]
机构：
[1] CGE,CTR RECH,DIV ELECTR & OPTIQUE,SECT COMPOSANTS ELECT,LAB MARCOUSSIS,ROUTE NOZAY 91,MARCOUSSIS,FRANCE
来源：
MICROELECTRONICS AND RELIABILITY | 1975年 / 14卷 / 03期
关键词：
D O I：
10.1016/0026-2714(75)90707-6
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：305 / &
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