THE LOW-TEMPERATURE INFRARED OPTICAL FUNCTIONS OF SRTIO3 DETERMINED BY REFLECTANCE SPECTROSCOPY AND SPECTROSCOPIC ELLIPSOMETRY

被引：83

作者：

KAMARAS, K

BARTH, KL

KEILMANN, F

HENN, R

REEDYK, M

THOMSEN, C

CARDONA, M

KIRCHER, J

RICHARDS, PL

STEHLE, JL

机构：

[1] UNIV CALIF BERKELEY,DEPT PHYS,BERKELEY,CA 94720

[2] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,DIV MAT SCI,BERKELEY,CA 94720

[3] SOPRA,F-92270 BOIS COLOMBES,FRANCE

来源：

JOURNAL OF APPLIED PHYSICS | 1995年 / 78卷 / 02期

关键词：

D O I：

10.1063/1.360364

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

By combining reflectance spectroscopy and spectroscopic ellipsometry, the complex dielectric function of SrTiO3 in the frequency range 40-5000 cm-1 at 20, 100, 200, and 300 K has been determined. Using a factorized description, analytical expressions for the optical quantities were derived, giving excellent agreement with the experimental data. These can be used for two-layer fits of films on SrTiO3, e.g., of high-T c superconductors. The fit parameters complement very well those found at higher temperatures. © 1995 American Institute of Physics.

引用

页码：1235 / 1240

页数：6

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