THE LOW-TEMPERATURE INFRARED OPTICAL FUNCTIONS OF SRTIO3 DETERMINED BY REFLECTANCE SPECTROSCOPY AND SPECTROSCOPIC ELLIPSOMETRY

被引：83
|
作者：
KAMARAS, K
BARTH, KL
KEILMANN, F
HENN, R
REEDYK, M
THOMSEN, C
CARDONA, M
KIRCHER, J
RICHARDS, PL
STEHLE, JL
机构：
[1] UNIV CALIF BERKELEY,DEPT PHYS,BERKELEY,CA 94720
[2] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,DIV MAT SCI,BERKELEY,CA 94720
[3] SOPRA,F-92270 BOIS COLOMBES,FRANCE
来源：
JOURNAL OF APPLIED PHYSICS | 1995年 / 78卷 / 02期
关键词：
D O I：
10.1063/1.360364
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
By combining reflectance spectroscopy and spectroscopic ellipsometry, the complex dielectric function of SrTiO3 in the frequency range 40-5000 cm-1 at 20, 100, 200, and 300 K has been determined. Using a factorized description, analytical expressions for the optical quantities were derived, giving excellent agreement with the experimental data. These can be used for two-layer fits of films on SrTiO3, e.g., of high-T c superconductors. The fit parameters complement very well those found at higher temperatures. © 1995 American Institute of Physics.
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页码：1235 / 1240
页数：6
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