INTERFERENTIAL METHOD FOR MEASURING LIFETIME OF CARRIERS IN SEMICONDUCTORS

被引：0

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作者：

KURBATOV, LN

OVCHINNIKOV, IM

SOROKONOVITSKY, NV

机构：

来源：

UKRAINSKII FIZICHESKII ZHURNAL | 1985年 / 30卷 / 06期

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中图分类号：

O4 [物理学];

学科分类号：

0702 ;

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页码：920 / 924

页数：5

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