THE OBSERVATION OF STACKING-FAULT TETRAHEDRA IN III-V COMPOUNDS

被引：7
|
作者：
DECOOMAN, BC [1 ]
MCKERNAN, S [1 ]
CARTER, CB [1 ]
RALSTON, JR [1 ]
WICKS, GW [1 ]
EASTMAN, LF [1 ]
机构：
[1] CORNELL UNIV,SCH ELECT ENGN,ITHACA,NY 14853
来源：
PHILOSOPHICAL MAGAZINE LETTERS | 1987年 / 56卷 / 03期
关键词：
ACKNOWLEDGMENT This work was supported by the Semiconductor Research Corporation; Micro-science and Technology Program and General Electric Co. s. McK. is supported by the Materials Science Center at Cornell. The electron microscopes are a Materials Science Center Facility and are funded; in part; by the NSF. The authors wish to thank R. Coles; M. Fabrizio and R. Cochran for technical assistance;
D O I：
10.1080/09500838708205254
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
16
引用
收藏
页码：85 / 90
页数：6
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