X-RAY PROBE MICROANALYSES AND SCANNING-X-RAY MICROSCOPIES

被引：17
|
作者：
CAZAUX, J
机构：
来源：
ULTRAMICROSCOPY | 1984年 / 12卷 / 04期
关键词：
D O I：
10.1016/0304-3991(83)90246-2
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：321 / 332
页数：12
相关论文
共 50 条
  • [1] SCANNING-X-RAY MICROSCOPY
    BURGE, RE
    BESWETHERICK, JT
    BROWNE, MT
    CHARALAMBOUS, PS
    DUKE, PJ
    FOSTER, GF
    HARE, AR
    MICHETTE, AG
    MORRIS, D
    MORRISON, GR
    POTTS, AW
    TAGUCHI, T
    X-RAY INSTRUMENTATION IN MEDICINE AND BIOLOGY, PLASMA PHYSICS, ASTROPHYSICS, AND SYNCHROTRON RADIATION, 1989, 1140 : 528 - 529
  • [2] STATUS OF THE SCANNING-X-RAY MICROSCOPE
    NIEMANN, B
    SCHMAHL, G
    RUDOLPH, D
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1981, 316 : 106 - 108
  • [3] IMAGING BY SCANNING-X-RAY MICROSCOPY
    BURGE, RE
    TAJBAKHSH, S
    JOURNAL OF PHOTOGRAPHIC SCIENCE, 1990, 38 (4-5): : 114 - 117
  • [4] ELEMENT MAPPING BY A SCANNING-X-RAY SYSTEM
    GURKER, N
    X-RAY SPECTROMETRY, 1979, 8 (04) : 149 - 158
  • [5] SCANNING-X-RAY STEPPER FOR SYNCHROTRON RADIATION
    CULLMANN, E
    VACH, W
    COOPER, K
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (07): : 2150 - 2152
  • [6] X-ray microanalyses in the variable pressure (environmental) scanning electron microscope
    Newbury, DE
    JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, 2002, 107 (06): : 567 - 603
  • [7] SCANNING-X-RAY MICRORADIOGRAPHY DEVELOPED IN AN SEM
    MOUZE, D
    THOMAS, X
    CAZAUX, J
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1986, 11 (02): : A8 - A8
  • [8] RECENT ADVANCES IN SCANNING-X-RAY MICROSCOPY
    MORRIS, D
    BUCKLEY, CJ
    MORRISON, GR
    MICHETTE, AG
    ANASTASI, PAF
    BROWNE, MT
    BURGE, RE
    CHARALAMBOUS, PS
    FOSTER, GF
    PALMER, JR
    DUKE, PJ
    SCANNING, 1991, 13 (01) : 7 - 10
  • [9] MICROANALYSIS BY SCANNING-X-RAY RADIOGRAPHY AND X-RAY-FLUORESCENCE - NEW CONCEPTION
    CAZAUX, J
    JOURNAL DE PHYSIQUE LETTRES, 1979, 40 (11): : L227 - L230
  • [10] DETERMINATION OF ORIENTATION DISTRIBUTION BY SCANNING-X-RAY DIFFRACTOGRAPHY
    HENTSCHEL, MP
    LANGE, A
    VOSSHENRICH, B
    PIOTTER, V
    KUNSTSTOFFE-GERMAN PLASTICS, 1990, 80 (12): : 1367 - 1370
12345