STRUCTURAL STUDY BY X-RAY-DIFFRACTION AND ELECTRON-MICROSCOPY OF CDY254

被引：0

作者：

TOMAS, A

GUYMONT, M

GUITTARD, M

GRATIAS, D

PORTIER, R

FLAHAUT, J

机构：

[1] FAC SCI PHARMACEUT & BIOL PARIS,CHIM MINERALE STRUCT LAB,F-75270 PARIS 06,FRANCE

[2] CNRS,CTR ETUD CHIM MET,F-94400 VITRY SUR SEINE,FRANCE

来源：

JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1985年 / 10卷 / 02期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：A31 / A31

页数：1

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