MEASUREMENT OF THE INTERNAL THERMAL-RESISTANCE OF SEMICONDUCTOR-DEVICES

被引：0
|
作者：
ZAKHARENKO, SK
SEMENOV, YG
机构：
来源：
TELECOMMUNICATIONS AND RADIO ENGINEERING | 1984年 / 38-9卷 / 09期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：139 / 140
页数：2
相关论文
共 50 条
  • [31] THERMAL INTERACTION OF SEMICONDUCTOR-DEVICES ON COPPER CLAD CERAMIC SUBSTRATES
    HUSSEIN, MM
    NELSON, DJ
    ELSHABINIRIAD, A
    IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1992, 15 (05): : 651 - 657
  • [32] CHECK OF SEMICONDUCTOR THERMAL-RESISTANCE ELEMENTS BY THE METHOD OF NOISE THERMOMETRY
    KISILEVSKII, AB
    PLOTNIKOVA, SP
    SOKOLOV, NA
    EISMONT, AI
    MEASUREMENT TECHNIQUES USSR, 1982, 25 (03): : 244 - 246
  • [33] LASER ANNEALING FOR SEMICONDUCTOR-DEVICES
    BOYD, IW
    WILSON, JIB
    NATURE, 1980, 287 (5780) : 278 - 278
  • [34] SEMICONDUCTOR-DEVICES AND CIRCUIT COMPONENTS
    MORINO, A
    ITO, M
    HIRAI, K
    TSUZUKI, N
    UCHIDA, H
    FUJII, S
    TAKADO, H
    NEC RESEARCH & DEVELOPMENT, 1980, (57): : 119 - 129
  • [35] APPLICATION OF SEMICONDUCTOR-DEVICES IN VOICING
    WALKER, JR
    JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 1977, 62 : S44 - S44
  • [36] POWER SEMICONDUCTOR-DEVICES - AN OVERVIEW
    HOWER, PL
    PROCEEDINGS OF THE IEEE, 1988, 76 (04) : 335 - 342
  • [37] SEMICONDUCTOR-DEVICES IN PHOTONIC SWITCHING
    IKEGAMI, T
    KAWAGUCHI, H
    IEEE JOURNAL ON SELECTED AREAS IN COMMUNICATIONS, 1988, 6 (07) : 1131 - 1140
  • [38] SEMICONDUCTOR-DEVICES AND PASSIVE COMPONENTS
    FOX, WM
    YOCOM, WH
    MUNK, PR
    SARTORI, EF
    BELL SYSTEM TECHNICAL JOURNAL, 1978, 57 (07): : 2405 - 2434
  • [39] LOOKING INSIDE SEMICONDUCTOR-DEVICES
    MILLER, GL
    ROBINSON, DA
    BELL LABORATORIES RECORD, 1975, 53 (02): : 129 - 135
  • [40] THERMOFUNCTIONAL HYPERSIMULATION OF SEMICONDUCTOR-DEVICES
    NIKOLAENKO, VI
    LOGVINOV, OV
    IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII RADIOELEKTRONIKA, 1991, 34 (01): : 101 - 105
12345