MEASUREMENT OF THE INTERNAL THERMAL-RESISTANCE OF SEMICONDUCTOR-DEVICES

被引：0
|
作者：
ZAKHARENKO, SK
SEMENOV, YG
机构：
来源：
TELECOMMUNICATIONS AND RADIO ENGINEERING | 1984年 / 38-9卷 / 09期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：139 / 140
页数：2
相关论文
共 50 条
  • [1] A SIMPLE TECHNIQUE FOR MEASUREMENT OF TRANSIENT THERMAL-RESISTANCE OF SEMICONDUCTOR-DEVICES
    SWARUP, P
    HARSH
    AGARWAL, SK
    INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1988, 26 (12) : 726 - 728
  • [2] THE EFFECT OF MAGNETIC PACKAGE LEADS ON THE MEASUREMENT OF THERMAL-RESISTANCE OF SEMICONDUCTOR-DEVICES
    BERNING, DW
    BLACKBURN, DL
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (05) : 609 - 611
  • [3] THERMAL DISTRIBUTIONS IN SEMICONDUCTOR-DEVICES
    MARSHALL, SL
    SOLID STATE TECHNOLOGY, 1978, 21 (07) : 33 - 33
  • [4] THERMAL DIAGNOSTICS OF SEMICONDUCTOR-DEVICES
    NOWAKOWSKI, A
    FIFTH ANNUAL IEEE SEMICONDUCTOR THERMAL AND TEMPERATURE MEASUREMENT SYMPOSIUM, 1989, : 146 - 146
  • [5] THERMAL FAILURE IN SEMICONDUCTOR-DEVICES
    DWYER, VM
    FRANKLIN, AJ
    CAMPBELL, DS
    SOLID-STATE ELECTRONICS, 1990, 33 (05) : 553 - 560
  • [6] TRANSIENT THERMAL STUDY OF SEMICONDUCTOR-DEVICES
    MIN, YJ
    PALISOC, AL
    LEE, CC
    IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1990, 13 (04): : 980 - 988
  • [7] SEMICONDUCTOR-DEVICES
    SEKIDO, K
    OKUTO, Y
    ABE, H
    MIKAMI, M
    HAMANO, K
    OKADA, K
    HAREYAMA, K
    KATO, H
    TANABE, N
    SAKUMA, H
    KUROBE, T
    MATSUDA, T
    MORI, K
    NAKAO, M
    FUJIOKA, T
    ONO, M
    YOKOYAMA, N
    HAREYAMA, K
    NAGAMI, A
    NOKUBO, J
    NAGAMI, A
    FUJITAKA, I
    KANEKO, H
    IWAMOTO, S
    KOSAKA, H
    SUGAYA, H
    SATO, F
    NAKASHIBA, H
    KOGUCHI, S
    YUKAWA, A
    SATAKE, T
    EGUCHI, S
    ITOH, S
    HIGASHIYAMA, N
    ARIIZUMI, M
    HIDESHIMA, K
    SAIJO, R
    TAKAYAMA, Y
    NAKATA, T
    KAJIMURA, T
    WAKAMATSU, S
    FURUTSUKA, T
    MINEO, A
    FURUSE, T
    MIYAIRI, K
    YOKOTA, H
    MORISHIGE, S
    KANEDA, K
    OGAWA, M
    SONE, J
    NEC RESEARCH & DEVELOPMENT, 1990, (96): : 339 - 381
  • [8] THE THERMAL-EQUILIBRIUM STATE OF SEMICONDUCTOR-DEVICES
    UNTERREITER, A
    APPLIED MATHEMATICS LETTERS, 1994, 7 (06) : 39 - 43
  • [9] ELECTROSTATIC DISCHARGE THERMAL FAILURE IN SEMICONDUCTOR-DEVICES
    DWYER, VM
    FRANKLIN, AJ
    CAMPBELL, DS
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1990, 37 (11) : 2381 - 2387
  • [10] MEASURING THERMAL-RESISTANCE IS KEY TO A COOL SEMICONDUCTOR
    SIEGEL, BS
    ELECTRONICS, 1978, 51 (14): : 121 - 126
12345