AGING OF CRITICAL CURRENTS AND IRREVERSIBILITY LINE IN MELT-TEXTURED YBA2CU3O7

被引：53
|
作者：
MARTINEZ, B
SANDIUMENGE, F
PINOL, S
VILALTA, N
FONTCUBERTA, J
OBRADORS, X
机构：
[1] Institut de Ciència de Materials de Barcelona, C.S.I.C., Campus Universitat Autònoma de Barcelona
来源：
APPLIED PHYSICS LETTERS | 1995年 / 66卷 / 06期
关键词：
D O I：
10.1063/1.114089
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The critical currents and the irreversibility line of bulk melt textured YBa2Cu3O7 have been found to evolve with the increase of the oxygenation time. A strong field-dependent reduction of the critical currents is observed which finally leads to a downward shift of the irreversibility line. Transmission electron microscopy micrographs of aged samples display a huge increase in the concentration of stacking faults near the microcracks and at the YBa2Cu3O7-Y2BaCuO5 interfaces. Low field ac susceptibility measured with H∥ab shows a strong reduction of the screening capability thus meaning that nonsuperconducting planar defects parallel to the ab planes have been created. We suggest that an enhanced two-dimensional behavior of the vortex flux lattice occurs when H∥c as a consequence of this layered defective structure.© 1995 American Institute of Physics.
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页码：772 / 774
页数：3
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